From 9f95ff5b6ba01db09552b84a0ab79607060a2666 Mon Sep 17 00:00:00 2001 From: Ali Labbene Date: Wed, 11 Dec 2019 08:59:21 +0100 Subject: Official ARM version: v5.4.0 Add CMSIS V5.4.0, please refer to index.html available under \docs folder. Note: content of \CMSIS\Core\Include has been copied under \Include to keep the same structure used in existing projects, and thus avoid projects mass update Note: the following components have been removed from ARM original delivery (as not used in ST packages) - CMSIS_EW2018.pdf - .gitattributes - .gitignore - \Device - \CMSIS - \CoreValidation - \DAP - \Documentation - \DoxyGen - \Driver - \Pack - \RTOS\CMSIS_RTOS_Tutorial.pdf - \RTOS\RTX - \RTOS\Template - \RTOS2\RTX - \Utilities - All ARM/GCC projects files are deleted from \DSP, \RTOS and \RTOS2 Change-Id: Ia026c3f0f0d016627a4fb5a9032852c33d24b4d3 --- docs/DAP/html/group__DAP__TestInput__gr.html | 165 +++++++++++++++++++++++++++ 1 file changed, 165 insertions(+) create mode 100644 docs/DAP/html/group__DAP__TestInput__gr.html (limited to 'docs/DAP/html/group__DAP__TestInput__gr.html') diff --git a/docs/DAP/html/group__DAP__TestInput__gr.html b/docs/DAP/html/group__DAP__TestInput__gr.html new file mode 100644 index 0000000..e6f1939 --- /dev/null +++ b/docs/DAP/html/group__DAP__TestInput__gr.html @@ -0,0 +1,165 @@ + + + + + +Test Input Commands +CMSIS-DAP: Test Input Commands + + + + + + + + + + + + + + +
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CMSIS-DAP +  Version 1.2.0 (Proposal) +
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Interface Firmware for CoreSight Debug Access Port
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Test Input Commands
CMSIS-DAP Commands
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Management commands for optional Test Inputs. +More...

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 DAP_TI_Info
 Get information about Test Input channel parameters of the CMSIS-DAP Debug Unit.
 
 DAP_TI_Value
 Get live data values from Test Input channels.
 
 DAP_TI_Capture
 Control continuous data recording of Test Input channels.
 
 DAP_TI_TransferBlock
 Transfer the data that are recorded for various Test Input channels.
 
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Description

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Management commands for optional Test Inputs.

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CMSIS-DAP provides a command set that allows to implement an optional Test Input (TI) management in the Debug Unit. Recording of up to 16 different Test Inputs is possible. Test Input values can be recorded as BYTE, SHORT, or WORD. The Debug Unit may include scaling parameters and dynamic ranges for a channel (for example a 14-bit value with a 2-bit range selection).

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Test Inputs could be used for various scenarios, for example:

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  • capture power measurement from A/D converters.
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  • capture wait states or cache misses from a memory system.
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  • capture data transfer parameters of an RF interface.
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  • test input pins of a Debug Unit.
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These Test Inputs can be recorded continuously with a specified trace recording frequency. The recording allows you to correlate the Test Input information with program execution. For recording of the CMSIS-DAP Firmware includes an optional Trace Data Management based on configurable memory blocks. This Trace Data Management also captures SWO trace information.

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Note
The Test Input Commands are only available when DAP_Info with ID=0xF0 (Capabilities) returns in Info - Bit 6: 1 = Trace Data Management.
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+Trace Data Management
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